IRHNA593160 mosfet equivalent, radiation hardened power mosfet.
n n n n n n n n n
Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Simple Drive Requirements Ease of Paralleling Hermetically Sealed Surface M.
These devices have been characterized for Single Event Effects (SEE) with useful performance up to an LET of 80 (MeV/(m.
Image gallery
Download